MOCVD Growth of High-Quality InN Films and Raman Characterization of Residual Stress Effects
2001 ◽
Vol 228
(1)
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pp. 1-4
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Keyword(s):
2010 ◽
Vol 53
(8)
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pp. 1445-1448
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Keyword(s):
1985 ◽
Vol 73
(1)
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pp. 83-95
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Keyword(s):
2015 ◽
Vol 2015
(26)
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pp. 4362-4372
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